Submit data to EKHI

EKHI indexes curve-level optical and thermal radiative property data with explicit provenance. Submissions are received by the editorial board and forwarded to the EKHI maintainers (Thermomat group, EHU), who decide on inclusion; every accepted dataset remains traceable to its source publication and credits its authors.

Prefer email? Send the same information to info@emissivity.org — every submission, by form or by mail, is reviewed by the editorial board before publication.

Source publication DOI

EKHI is publication-centred: data must trace to a published source

Material(s)

e.g. polycrystalline SiC; α-Al₂O₃ ⟨0001⟩

Property / quantity

e.g. normal spectral emissivity; hemispherical reflectance

Temperature

In kelvin — a single value or a range, e.g. 1200 K; 300–1800 K

Spectral variable and range

Wavelength or wavenumber, with unit — e.g. 2–25 µm; 400–5000 cm⁻¹

Measurement geometry

Incidence / emission angle and collection — directional or hemispherical, e.g. normal (0°), directional; 8° incidence, hemispherical collection

Standard uncertainty

As stated in the source, with coverage factor if given (e.g. 0.02, k = 1) — or "none reported"

Preferred file format Other conditions

Atmosphere or vacuum, surface finish, specimen notes

Where the data lives

Link to files (Zenodo, institutional repository, supplementary material) or note that you will email them

Your name Your email Affiliation